[n] Choi H., Baang S., Baek S.H., Chang Y.B., Kim K., Kim Y.J., Kim S.B., Kim M.K., Kim J.H., Kim J.S., Lee S.I., Lee Y.H., Lim B.S., Park H.K., Park K.R., Yee J., Yoon C.S., “Data Acquisition and Control System for Samsung Superconductor Test Facility”, in Proc. ICALEPCS'99, Trieste, Italy, Oct. 1999, paper TC1P70, pp. XX-XX.
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Paper Title: Data Acquisition and Control System for Samsung Superconductor Test Facility
Paper URL: https://jacow.org/ica99/papers/TC1P70.pdf
Conference: 7th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'99)
Paper ID: TC1P70
Location in proceedings:
Original Author String: Choi H., Baang S., Baek S.H., Chang Y.B., Kim K., Kim Y.J., Kim S.B., Kim M.K., Kim J.H., Kim J.S., Lee S.I., Lee Y.H., Lim B.S., Park H.K., Park K.R., Yee J., Yoon C.S.