[n] S. Fu, T. Kato, F. Naito, and K. Yoshino, “324-MHz RF Deflector Design and Test”, in Proc. LINAC'98, Chicago, IL, USA, Aug. 1998, paper TU4079, pp. 585-587.
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Paper Title: 324-MHz RF Deflector Design and Test
Paper URL: https://jacow.org/l98/papers/TU4079.pdf
Conference: 19th Int. LINAC Conf. (LINAC'98)
Paper ID: TU4079
Location in proceedings: 585-587
Original Author String: S. Fu,T. Kato,F. Naito,K. Yoshino