[n] G. E. Leyh, “A Critical Analysis of IGBT Geometries, with the Intention of Mitigating Undesirable Destruction Caused by Fault Scenarios of an Adverse Nature”, in Proc. PAC'03, Portland, OR, USA, May 2003, paper TPAE041, pp. 1174-1176.
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Paper Title: A Critical Analysis of IGBT Geometries, with the Intention of Mitigating Undesirable Destruction Caused by Fault Scenarios of an Adverse Nature
Paper URL: https://jacow.org/p03/papers/TPAE041.pdf
Conference: 20th Particle Accelerator Conf. (PAC'03)
Paper ID: TPAE041
Location in proceedings: 1174-1176
Original Author String: G.E. Leyh