Reference Search

[n]	T. Saito et al., “Technical Development of Profile Measurement for the Soft X-Ray Via Compton Backward Scattering”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper RPAP011, pp. 1260-1262. 

Paper Title: Technical Development of Profile Measurement for the Soft X-Ray Via Compton Backward Scattering
Paper URL: https://jacow.org/p05/papers/RPAP011.pdf
Conference: 21st Particle Accelerator Conf. (PAC'05)
Paper ID: RPAP011
Location in proceedings: 1260-1262
Original Author String: T. Saito, Y. Hama, RISE, Tokyo; H. Hayano, KEK, Ibaraki; K. Hidume, RISE, Tokyo; S. Kashiwagi, ISIR, Osaka; R. Kuroda, AIST, Tsukuba, Ibaraki; S. Minamiguchi, A. Oshima, D. Ueyama, RISE, Tokyo; J.U. Urakawa, KEK, Ibaraki; M. Washio, RISE, Tokyo

Associated Authors

• H. Hayano
• S. Kashiwagi
• Y. Hama
• R. Kuroda
• M. Washio
• T. Saito
• K. Hidume
• S. Minamiguchi
• D. Ueyama
• A. Oshima
• J. U. Urakawa