Reference Search

[n]	W. Zhang et al., “Electromigration Issues in High Current Horn”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper RPPT066, pp. 3700-3702. 

Paper Title: Electromigration Issues in High Current Horn
Paper URL: https://jacow.org/p05/papers/RPPT066.pdf
Conference: 21st Particle Accelerator Conf. (PAC'05)
Paper ID: RPPT066
Location in proceedings: 3700-3702
Original Author String: W. Zhang, S. Bellavia, BNL, Upton, Long Island, New York; B. Hseuh, JHU, Baltimore, Maryland; J. Sandberg, N. Simos, J.E. Tuozzolo, W.-T. Weng, BNL, Upton, Long Island, New York

Associated Authors

• J. E. Tuozzolo
• S. Bellavia
• J. Sandberg
• W. Zhang
• N. Simos
• W.-T. Weng
• B. Hseuh