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[n]	P. S. Yoon, C. L. Bohn, and W. Chou, “Simulations of Error-Induced Beam Degradation in Fermilab's Booster Synchrotron”, in Proc. PAC'05, Knoxville, TN, USA, May 2005, paper TPAT015, pp. 1458-1460. 

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Paper Title: Simulations of Error-Induced Beam Degradation in Fermilab's Booster Synchrotron
Paper URL: https://jacow.org/p05/papers/TPAT015.pdf
Conference: 21st Particle Accelerator Conf. (PAC'05)
Paper ID: TPAT015
Location in proceedings: 1458-1460
Original Author String: P.S. Yoon, Rochester University, Rochester, New York; C.L. Bohn, Northern Illinois University, DeKalb, Illinois; W. Chou, Fermilab, Batavia, Illinois

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