[n] S. P. Antipov et al., “Experimental Test of Semiconductor Dechirper”, in Proc. IPAC'15, Richmond, VA, USA, May 2015, pp. 1932-1934. doi:10.18429/JACoW-IPAC2015-TUPMA043
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Paper Title: Experimental Test of Semiconductor Dechirper
Paper URL: https://jacow.org/IPAC2015/papers/TUPMA043.pdf
Conference: 6th Int. Particle Accelerator Conf. (IPAC'15)
Paper ID: TUPMA043
Location in proceedings: 1932-1934
Original Author String: S.P. Antipov, S.V. Baryshev, C.-J. Jing, A. Kanareykin [Euclid TechLabs, LLC, Solon, Ohio, USA] S. Baturin [LETI, Saint-Petersburg, Russia] M.G. Fedurin, K. Kusche, C. Swinson [BNL, Upton, Long Island, New York, USA] W. Gai, S. Stoupin, A. Zholents [ANL, Argonne, Illinois, USA]