[n] H. Tian, M. J. Kelley, G. Ribeill, and C. E. Reece, “Surface roughness characterization of niobium subjected to incremental BCP and EP processing steps”, in Proc. SRF'07, Beijing, China, Oct. 2007, paper WEP04, pp. XX-XX.
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Paper Title: Surface roughness characterization of niobium subjected to incremental BCP and EP processing steps
Paper URL: https://jacow.org/srf2007/papers/WEP04.pdf
Conference: 13th Int. Conf. RF Superconductivity (SRF'07)
Paper ID: WEP04
Location in proceedings:
Original Author String: H. Tian, M. J. Kelley, TJNAF/College of William and Mary; G. Ribeill, North Carolina State University; C. E. Reece, TJNAF