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[n]	J. Oegren, V. G. Ziemann, S. H. M. Jafri, and K. Leifer, “Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope”, in Proc. IPAC'16, Busan, Korea, May 2016, pp. 283-285. doi:10.18429/JACoW-IPAC2016-MOPMR023

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Paper Title: Surface Characterization and Field Emission Measurements of Copper Samples inside a Scanning Electron Microscope
Paper URL: https://jacow.org/ipac2016/papers/MOPMR023.pdf
Conference: 7th Int. Particle Accelerator Conf. (IPAC'16)
Paper ID: MOPMR023
Location in proceedings: 283-285
Original Author String: J. Oegren (J. ?ûgren), V.G. Ziemann [Uppsala University, Uppsala, Sweden] S.H.M. Jafri, K. Leifer [Uppsala University, Department of Engineering Sciences, Uppsala, Sweden]

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