[n] J. Yan, T. L. Allison, S. Bruhwel, and W. Lu, “Signal Processing for Beam Loss Monitor System at Jefferson Lab”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 245-248. doi:10.18429/JACoW-IBIC2018-TUPA16
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Paper Title: Signal Processing for Beam Loss Monitor System at Jefferson Lab
Paper URL: https://jacow.org/IBIC2018/papers/TUPA16.pdf
Conference: 7th Int. Beam Instrumentation Conf. (IBIC'18)
Paper ID: TUPA16
Location in proceedings: 245-248
Original Author String: J. Yan,T. L. Allison,S. Bruhwel,W. Lu