[n] C. Kim, H.-S. Kang, G. Kim, I. S. Ko, and J. H. Ko, “Micro-Bunching Instability Monitor for X-ray Free Electron Laser”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 404-406. doi:10.18429/JACoW-IBIC2018-WEPA16
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Paper Title: Micro-Bunching Instability Monitor for X-ray Free Electron Laser
Paper URL: https://jacow.org/IBIC2018/papers/WEPA16.pdf
Conference: 7th Int. Beam Instrumentation Conf. (IBIC'18)
Paper ID: WEPA16
Location in proceedings: 404-406
Original Author String: C. Kim,H.-S. Kang,G. Kim,I. S. Ko,J. H. Ko