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[n]	L. G. Sukhikh, G. Kube, A. Potylitsyn, S. A. Strokov, and K. Wittenburg, “Grating Scanner for Measurement of Micron-size Beam Profiles”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 448-450. doi:10.18429/JACoW-IBIC2018-WEPB10

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Paper Title: Grating Scanner for Measurement of Micron-size Beam Profiles
Paper URL: https://jacow.org/IBIC2018/papers/WEPB10.pdf
Conference: 7th Int. Beam Instrumentation Conf. (IBIC'18)
Paper ID: WEPB10
Location in proceedings: 448-450
Original Author String: L. G. Sukhikh,G. Kube,A. Potylitsyn,S. A. Strokov,K. Wittenburg

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