[n] C. Liu et al., “Transverse Beam Emittance Measurements with Multi-Slit and Moving-Slit Devices for LEReC”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 486-489. doi:10.18429/JACoW-IBIC2018-WEPB21
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Paper Title: Transverse Beam Emittance Measurements with Multi-Slit and Moving-Slit Devices for LEReC
Paper URL: https://jacow.org/IBIC2018/papers/WEPB21.pdf
Conference: 7th Int. Beam Instrumentation Conf. (IBIC'18)
Paper ID: WEPB21
Location in proceedings: 486-489
Original Author String: C. Liu,A. V. Fedotov,A. Fuchs,D. M. Gassner,X. Gu,D. Kayran,J. Kewisch,T. A. Miller,M. G. Minty,V. Ptitsyn,S. Seletskiy,A. Sukhanov,D. Weiss