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[n]	T. Lensch, S. Liu, and M. Scholz, “The European XFEL Wire Scanner System”, in Proc. IBIC'18, Shanghai, China, Sep. 2018, pp. 498-500. doi:10.18429/JACoW-IBIC2018-WEPC05

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Paper Title: The European XFEL Wire Scanner System
Paper URL: https://jacow.org/IBIC2018/papers/WEPC05.pdf
Conference: 7th Int. Beam Instrumentation Conf. (IBIC'18)
Paper ID: WEPC05
Location in proceedings: 498-500
Original Author String: T. Lensch,S. Liu,M. Scholz

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