[n] T. Plath et al., “Extraction of the Longitudinal Profile of the Transverse Emittance From Single-Shot RF Deflector Measurements at sFLASH”, in Proc. FEL'17, Santa Fe, NM, USA, Aug. 2017, pp. 98-101. doi:10.18429/JACoW-FEL2017-MOP028
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Paper Title: Extraction of the Longitudinal Profile of the Transverse Emittance From Single-Shot RF Deflector Measurements at sFLASH
Paper URL: https://jacow.org/fel2017/papers/MOP028.pdf
Conference: 38th Int. Free Electron Laser Conf. (FEL'17)
Paper ID: MOP028
Location in proceedings: 98-101
Original Author String: T. Plath,Ph. Amstutz,J. B?Âdewadt,N. Ekanayake,S. Khan,T. Laarmann,L. L. Lazzarino,C. Lechner,Th. Maltezopoulos,V. Miltchev,J. Ro?ƒbach