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[n]	R. Jiang, J. Chen, and Y. B. Leng, “High-Accuracy Diagnostic Tool for Beam Position Monitor Troubleshooting in SSRF Based on Clustering Analysis”, in Proc. IBIC'20, Santos, Brazil, Sep. 2020, pp. 166-169. doi:10.18429/JACoW-IBIC2020-WEPP28

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Paper Title: High-Accuracy Diagnostic Tool for Beam Position Monitor Troubleshooting in SSRF Based on Clustering Analysis
Paper URL: http://accelconf.web.cern.ch/ibic2020/papers/WEPP28.pdf
Conference: 9th Int. Beam Instrumentation Conf. (IBIC'20)
Paper ID: WEPP28
Location in proceedings: 166-169
Original Author String: R. Jiang,J. Chen,Y. B. Leng

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