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[n]	M. Camarda et al., “Towards Full Silicon 4H-SiC Based X-Ray Beam Monitoring”, in Proc. IBIC'19, Malmö, Sweden, Sep. 2019, pp. 665-668. doi:10.18429/JACoW-IBIC2019-THAO02

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Paper Title: Towards Full Silicon 4H-SiC Based X-Ray Beam Monitoring
Paper URL: https://jacow.org/ibic2019/papers/THAO02.pdf
Conference: 8th Int. Beam Instrumentation Conf. (IBIC'19)
Paper ID: THAO02
Location in proceedings: 665-668
Original Author String: M. Camarda,M. Birri,M. Carulla,D. Grolimund,U. Grossner,B. Meyer,S. M. Nida,C. Pradervand,A. Tsibizov,T. Ziemann

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