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[n]	J. W. Angle, G. V. Eremeev, M. J. Kelley, U. Pudasaini, C. E. Reece, and J. Tuggle, “Crystallographic Characterization of Nb?Sn Coatings and N-Doped Niobium via EBSD and SIMS”, in Proc. SRF'19, Dresden, Germany, Jun.-Jul. 2019, pp. 871-875. doi:10.18429/JACoW-SRF2019-THP017

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Paper Title: Crystallographic Characterization of Nb?Sn Coatings and N-Doped Niobium via EBSD and SIMS
Paper URL: https://jacow.org/srf2019/papers/THP017.pdf
Conference: 19th Int. Conf. RF Superconductivity (SRF'19)
Paper ID: THP017
Location in proceedings: 871-875
Original Author String: J. W. Angle,G. V. Eremeev,M. J. Kelley,U. Pudasaini,C. E. Reece,J. Tuggle

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