[n] H. Ito et al., “Lower Critical Field Measurement of NbN Multilayer Thin Film Superconductor at KEK”, in Proc. SRF'19, Dresden, Germany, Jun.-Jul. 2019, pp. 632-636. doi:10.18429/JACoW-SRF2019-TUP078
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Paper Title: Lower Critical Field Measurement of NbN Multilayer Thin Film Superconductor at KEK
Paper URL: https://jacow.org/srf2019/papers/TUP078.pdf
Conference: 19th Int. Conf. RF Superconductivity (SRF'19)
Paper ID: TUP078
Location in proceedings: 632-636
Original Author String: H. Ito,C. Z. Antoine,H. Hayano,R. Ito,Y. Iwashita,R. Katayama,T. Kubo,T. Nagata,T. Saeki,H. Tongu