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[n]	S. J. Lee, J. H. Han, Y. G. Jung, D. E. Kim, and G. Mun, “Radiation Damage Monitoring at PAL-XFEL”, in Proc. FEL'19, Hamburg, Germany, Aug. 2019, pp. 528-530. doi:10.18429/JACoW-FEL2019-WEP093

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Paper Title: Radiation Damage Monitoring at PAL-XFEL
Paper URL: https://jacow.org/fel2019/papers/WEP093.pdf
Conference: 39th Int. Free Electron Laser Conf. (FEL'19)
Paper ID: WEP093
Location in proceedings: 528-530
Original Author String: S. J. Lee,J. H. Han,Y. G. Jung,D. E. Kim,G. Mun

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