[n] B. Gao, Y. B. Leng, and X. Y. Xu, “Deep Learning Applied for Multi-Slit Imaging Based Beam Size Monitor”, in Proc. IPAC'19, Melbourne, Australia, May 2019, pp. 2587-2590. doi:10.18429/JACoW-IPAC2019-WEPGW049
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Paper Title: Deep Learning Applied for Multi-Slit Imaging Based Beam Size Monitor
Paper URL: http://accelconf.web.cern.ch/ipac2019/papers/WEPGW049.pdf
Conference: 10th Int. Particle Accelerator Conf. (IPAC'19)
Paper ID: WEPGW049
Location in proceedings: 2587-2590
Original Author String: B. Gao,Y. B. Leng,X. Y. Xu