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S. J. Smith, R. Apsimon, G. Burt, S. Setiniyaz, and M. J. W. Southerby, “Visualisation of Pareto Optimal Spaces and Optimisation Solution Selection Using Parallel Coordinate Plots”, in Proc. 13th Int. Particle Accelerator Conf. (IPAC'22), Bangkok, Thailand, Jun. 2022, pp. 2487-2490. |
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D. J. Seal et al., “First RF Measurements of Planar SRF Thin Films with a High Throughput Test Facility at Daresbury Laboratory”, in Proc. 13th Int. Particle Accelerator Conf. (IPAC'22), Bangkok, Thailand, Jun. 2022, pp. 1283-1286. |
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W. L. Millar, G. Burt, and W. Wuensch, “Monte Carlo Model of High-Voltage Conditioning and Operation”, in Proc. 31st Linear Accelerator Conf. (LINAC'22), Liverpool, UK, Aug.-Sep. 2022, pp. 283-286. |
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S. J. Smith and G. Burt, “Limits on Standing Wave Cavity Performance Due to Thermal Effects”, in Proc. 31st Linear Accelerator Conf. (LINAC'22), Liverpool, UK, Aug.-Sep. 2022, pp. 287-289. |
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B. S. Sian, G. Burt, O. B. Malyshev, H. S. Marks, D. J. Seal, and R. Valizadeh, “Split Thin Film SRF 6 GHz Cavities”, in Proc. 31st Linear Accelerator Conf. (LINAC'22), Liverpool, UK, Aug.-Sep. 2022, pp. 814-817. |
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D. J. Seal et al., “RF Characterisation of Bulk Niobium and Thin Film Coated Planar Samples at 7.8 GHz”, in Proc. 31st Linear Accelerator Conf. (LINAC'22), Liverpool, UK, Aug.-Sep. 2022, pp. 818-821. |
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R. C. Peacock et al., “Pulsed DC High Field Measurements of Irradiated and Non-Irradiated Electrodes of Different Materials”, in Proc. 31st Linear Accelerator Conf. (LINAC'22), Liverpool, UK, Aug.-Sep. 2022, pp. 441-444. |
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P. A. McIntosh, G. Burt, and J. M. Byrd, “Closing LINAC2022 ÔÇô Announcement of LINAC2024”, presented at the 31st Linear Accelerator Conf. (LINAC'22), Liverpool, UK, Aug.-Sep. 2022, paper FRCTA01, unpublished. |
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D. A. Turner et al., “Magnetic Field Penetration of Niobium Thin Films Produced by the ARIES Collaboration”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 77. |
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D. J. Seal et al., “A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100. |
