[n] D. J. Seal et al., “A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate”, in Proc. SRF'21, East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100. doi:10.18429/JACoW-SRF2021-SUPFDV016
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Paper Title: A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate
Paper URL: https://jacow.org/srf2021/papers/SUPFDV016.pdf
Conference: 20th Int. Conf. RF Superconductivity (SRF'21)
Paper ID: SUPFDV016
Location in proceedings: 100
Original Author String: D.J. Seal, G. Burt, B.S. Sian, P. Goudket, O.B. Malyshev, R. Valizadeh, J.A. Conlon