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Author: C. E. Reece


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Reference
C. E. Reece and H. Tian, “Exploiting New Electrochemical Understanding of Niobium Electropolishing for Improved Performance of SRF Cavities for CEBAF”, in Proc. 25th Linear Accelerator Conf. (LINAC'10), Tsukuba, Japan, Sep. 2010, paper THP010, pp. 779-781.
C. E. Reece, N. Pogue, and P. M. McIntyre, “Ultimate-Gradient Srf Test Cavity and Low Loss Tangent Measurements in Ultra Pure Sapphire”, in Proc. 25th Linear Accelerator Conf. (LINAC'10), Tsukuba, Japan, Sep. 2010, paper THP038, pp. 842-844.


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