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Author: H. Tian


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Reference
H. Tian et al., “Recent XPS Studies of the Effect of Processing on NB SRF Surfaces”, in Proc. 13th Int. Conf. RF Superconductivity (SRF'07), Beijing, China, Oct. 2007, paper TUP18, pp. XX-XX.
H. Tian, M. J. Kelley, S. G. Corcoran, and C. E. Reece, “Novel Characterization of the Electropolishing of Niobium with Sulfuric and Hydrofluoric Acid Mixtures”, in Proc. 13th Int. Conf. RF Superconductivity (SRF'07), Beijing, China, Oct. 2007, paper WE104, pp. XX-XX.
H. Tian, M. J. Kelley, G. Ribeill, and C. E. Reece, “Surface roughness characterization of niobium subjected to incremental BCP and EP processing steps”, in Proc. 13th Int. Conf. RF Superconductivity (SRF'07), Beijing, China, Oct. 2007, paper WEP04, pp. XX-XX.
J. K. Spradlin, A. D. Palczewski, C. E. Reece, and H. Tian, “Analysis of Surface Nitrides Created During Doping" Heat Treatments of Niobium"”, in Proc. 19th Int. Conf. RF Superconductivity (SRF'19), Dresden, Germany, Jun.-Jul. 2019, pp. 106-111.
C. E. Reece and H. Tian, “Exploiting New Electrochemical Understanding of Niobium Electropolishing for Improved Performance of SRF Cavities for CEBAF”, in Proc. 25th Linear Accelerator Conf. (LINAC'10), Tsukuba, Japan, Sep. 2010, paper THP010, pp. 779-781.


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