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Author: H. Tian


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Reference
C. E. Reece and H. Tian, “Exploiting New Electrochemical Understanding of Niobium Electropolishing for Improved Performance of SRF Cavities for CEBAF”, in Proc. 25th Linear Accelerator Conf. (LINAC'10), Tsukuba, Japan, Sep. 2010, paper THP010, pp. 779-781.
A. T. Wu et al., “Buffered Electropolishing ÔÇô A New Way for Achieving Extremely Smooth Surface Finish on Nb SRF Cavities to be Used in Particle Accelerators”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper WE5PFP060, pp. 2141-2143.
A. M. Valente, H. Tian, M. J. Kelley, C. McGuinness, P. A. Glans, and K. E. Smith, “Near-Surface Composition of Electropolished Niobium by Variable Photon Energy XPS”, in Proc. 11th Workshop RF Superconductivity (SRF'03), Lübeck, Germany, Sep. 2003, paper MOP15, pp. 63-65.
A. D. Palczewski, R. L. Geng, and H. Tian, “Optimizing Centrifugal Barrel Polishing for Mirror Finish SRFCavity and Rf Tests at Jefferson Lab”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper WEPPC094, pp. 2435-2437.
A. D. Palczewski, C. E. Reece, H. Tian, and O. Trofimova, “Detailed Surface Analysis of Incremental Centrifugal Barrel Polishing (CBP) of Single-Crystal Niobium Samples”, in Proc. 15th Int. Conf. RF Superconductivity (SRF'11), Chicago, IL, USA, Jul. 2011, paper THPO071, pp. 908-911.


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