JaCoW Logo

Reference Search

Author: P. Forck


References



Reference
T. Sieber et al., “Bunch Shape Measurements at the GSI CW-Linac Prototype”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 2091-2094.
T. Sieber et al., “Beam Diagnostics Layout for the FAIR Proton Linac”, in Proc. 27th Linear Accelerator Conf. (LINAC'14), Geneva, Switzerland, Aug.-Sep. 2014, paper THPP063, pp. 998-1000.
T. Milosic, P. Forck, and D. A. Liakin, “Longitudinal Emittance Measurement Using Particle Detectors”, in Proc. 9th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'09), Basel, Switzerland, May 2009, paper TUPD18, pp. 330-332.
T. Giacomini, P. Forck, J. G. De Villiers, J. Dietrich, and D. A. Liakin, “Ionization Profile Monitors - IPM @ GSI”, in Proc. 10th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'11), Hamburg, Germany, May 2011, paper TUPD51, pp. 419-421.
T. Giacomini, P. Forck, D. A. Liakin, and V. Skachkov, “Improving the Reliability of IPM”, in Proc. 7th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'05), Lyon, France, Jun. 2005, paper POT004, pp. XX-XX.
S. Yaramyshev et al., “Benchmarking of Measurement and Simulation of Transverse RMS-Emittance Growth Along an Alvarez DTL”, in Proc. 24th Linear Accelerator Conf. (LINAC'08), Victoria, Canada, Sep.-Oct. 2008, paper MOP075, pp. 251-253.
S. V. Barabin, P. Forck, T. Giacomini, D. A. Liakin, and A. Y. Orlov, “Testing the Silicon Photomultiplier for Ionization Profile Monitor”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper TUPCH071, pp. 1172-1174.
S. Udrea, P. Forck, C. M. Kleffner, K. Knie, and T. Sieber, “The Beam Diagnostics Test Bench for the Commissioning of the Proton Linac at FAIR”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 196-199.
S. Udrea et al., “Preparatory Work for a Fluorescence Based Profile Monitor for an Electron Lens”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 528-531.
S. Udrea et al., “Development of a Fluorescence Based Gas Sheet Profile Monitor for Use With Electron Lenses: Optical System Design and Preparatory Experiments”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 359-363.


Back to the list