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Author: O. Singh


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Reference
W. X. Cheng et al., “Characterization of NSLS2 Storage Ring Beam Orbit Stability”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 625-629.
A. Caracappa, C. Danneil, R. P. Fliller, D. Padrazo, and O. Singh, “A PPS Compliant Injected Charge Monitor at NSLS-II”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 422-425.
A. Caracappa, C. Danneil, A. J. Della Penna, R. P. Fliller, D. Padrazo, and O. Singh, “A PPS Compliant Stored Beam Current Monitor at NSLS-II”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 426-429.
O. Singh and I. Pinayev, “Overview of Beam Instrumentation and Diagnostics for the NSLS-II Project”, in Proc. 13th Beam Instrumentation Workshop (BIW'08), Lake Tahoe, CA, USA, May 2008, paper TUPTPF049, pp. 222-226.
A. Blednykh et al., “Rogue Mode Shielding in NSLS-II Multipole Vacuum Chambers”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM033, pp. 194-198.
I. Pinayev, A. Blednykh, B. N. Kosciuk, and O. Singh, “Optimization of Small Aperture Beam Position Monitors for NSLS-II Project”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM034, pp. 199-200.
K. Vetter et al., “NSLS-II RF Beam Position Monitor”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM037, pp. 205-209.
D. Padrazo et al., “NSLS-II Injector System Diagnostics”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM098, pp. 437-441.
W. X. Cheng, B. Bacha, and O. Singh, “NSLS2 Beam Position Monitor Calibration”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOPG022, pp. 77-79.
D. Padrazo et al., “NSLS-II Injector System Diagnostics Update for LINAC Commissioning”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper TUPG019, pp. 173-176.


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