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Author: R. Ischebeck


References



Reference
F. Zimmermann et al., “Advanced accelerator concepts for dark sector searches and fast muon acceleration”, presented at the 15th Int. Particle Accelerator Conf. (IPAC'24), Nashville, TN, USA, May 2024, paper MOPR17, this conference.
F. Zimmermann et al., “Dark sector searches based on dielectric laser acceleration”, in Proc. 14th Int. Particle Accelerator Conf. (IPAC'23), Venice, Italy, May 2023, paper MOPL068, pp. 702-704.
F.-J. Decker et al., “Energy Doubling in a Plasma Wakefield Accelerator”, in Proc. 23rd Linear Accelerator Conf. (LINAC'06), Knoxville, TN, USA, Aug. 2006, paper MO2002, pp. 16-16.
F.-J. Decker et al., “Positron Source from X-rays Emitted by Plasma Betatron Motion”, in Proc. 23rd Linear Accelerator Conf. (LINAC'06), Knoxville, TN, USA, Aug. 2006, paper MOP026, pp. 94-96.
G. L. Orlandi et al., “Bunch-Compressor Transverse Profile Monitors of the SwissFEL Injector Test Facility”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPB82, pp. 271-275.
G. L. Orlandi et al., “Characterization of Compressed Bunches in the SwissFEL Injector Test Facility”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper TUPF08, pp. 515-518.
G. L. Orlandi et al., “Design and Test of Wire-Scanners for SwissFEL”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper THP091, pp. 948-951.
G. L. Orlandi et al., “FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 249-252.
G. L. Orlandi et al., “First Experimental Results of the Commissioning of the SwissFEL Wire-Scanners”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 388-392.
G. L. Orlandi et al., “Wire-Scanners with Sub-Micrometer Resolution: Developments and Measurements”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 307-310.


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