[n] G. L. Orlandi et al., “FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.”, in Proc. IBIC'19, Malmö, Sweden, Sep. 2019, pp. 249-252. doi:10.18429/JACoW-IBIC2019-TUBO02
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Paper Title: FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.
Paper URL: https://jacow.org/ibic2019/papers/TUBO02.pdf
Conference: 8th Int. Beam Instrumentation Conf. (IBIC'19)
Paper ID: TUBO02
Location in proceedings: 249-252
Original Author String: G. L. Orlandi,S. Borrelli,N. Cefarin,S. Dal Zilio,Ch. David,M. Ferianis,E. Ferrari,V. Guzenko,B. Hermann,O. Huerzeler,R. Ischebeck,M. Lazzarino,C. Lombosi,C. Ozkan Loch,G. Penco,E. Prat,M. Veronese