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Author: J. Roßbach


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Reference
J. Rossbach, “Options and Trade-Offs in Linear Collider Design”, in Proc. 16th Particle Accelerator Conf. (PAC'95), Dallas, TX, USA, May 1995, paper WAG02, pp. 611-615.
C. Lechner et al., “Concept for a Seeded FEL at FLASH2”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 34-37.
T. Plath et al., “Extraction of the Longitudinal Profile of the Transverse Emittance From Single-Shot RF Deflector Measurements at sFLASH”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 98-101.
V. Grattoni et al., “Status of Seeding Development at sFLASH”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 136-139.
C. P. Maag, I. Bahns, J. Ro?ƒbach, H. Sinn, P. Thiessen, and J. Zemella, “An Experimental Setup for Probing the Thermal Properties of Diamond Regarding Its Use in an XFELO”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 200-203.
I. Bahns et al., “Thermal and Mechanical Stability of Bragg Reflectors under Pulsed XFEL Radiation”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 240-243.
J. B?Âdewadt et al., “Determination of the Slice Energy Spread of Ultra-Relativistic Electron Beams by Scanning Seeded Coherent Undulator Radiation”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 326-328.
P. Rauer, I. Bahns, W. Decking, W. Hillert, J. Ro?ƒbach, and H. Sinn, “Integration of an XFELO at the European XFEL Facility”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 62-65.
C. Lechner et al., “Seeding R&D at sFLASH”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 230-233.
I. Bahns, W. Hillert, P. Rauer, J. Ro?ƒbach, and H. Sinn, “Interaction of Powerful Electro-Magnetic Fields With Bragg Reflectors”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 673-676.


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