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Author: A. I. Pikin


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Reference
L. Zhao, E. G. Evstati, J. S. Kim, E. N. Beebe, and A. I. Pikin, “Simulation of Electron and Ion Dynamics in an EBIS”, in Proc. 12th Int. Conf. on Heavy Ion Accelerator Technology (HIAT'12), Chicago, IL, USA, Jun. 2012, paper PO17, pp. 97-100.
M. Okamura et al., “Beam Commissioning of the RFQ for the RHIC-EBIS Project”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper FR5REP046, pp. 4872-4874.
M. Okamura et al., “Low Charge State Laser Ion Source for the EBIS Injector”, in Proc. 27th Linear Accelerator Conf. (LINAC'14), Geneva, Switzerland, Aug.-Sep. 2014, paper MOPP010, pp. 64-66.
M. Okamura et al., “Performance of the Low Charge State Laser Ion Source in BNL”, in Proc. 13th Int. Conf. on Heavy Ion Accelerator Technology (HIAT'15), Yokohama, Japan, Sep. 2015, paper THM1C03, pp. 274-276.
M. Okamura et al., “Performance of the Low Charge State Laser Ion Source in BNL”, in Proc. North American Particle Accelerator Conf. (NAPAC'16), Chicago, IL, USA, Oct. 2016, pp. 49-53.
O. H. Rahman et al., “Cathode Performance during Two Beam Operation of the High Current High Polarization Electron Gun for eRHIC”, in Proc. 6th Int. Particle Accelerator Conf. (IPAC'15), Richmond, VA, USA, May 2015, pp. 2720-2722.
O. H. Rahman et al., “The Cathode Preparation Chamber for the DC High Current High Polarization Gun”, in Proc. North American Particle Accelerator Conf. (NAPAC'13), Pasadena, CA, USA, Sep.-Oct. 2013, paper TUPSM06, pp. 640-642.
P. Thieberger et al., “Design of a Proton-Electron Beam Overlap Monitor for the New RHIC Electron Lens based on Detecting Energetic Backscattered Electrons”, in Proc. 15th Beam Instrumentation Workshop (BIW'12), Newport News, VA, USA, Apr. 2012, paper MOPG025, pp. 86-88.
P. Thieberger et al., “High Energy Coulomb Scattered Electrons Detected in Air Used as the Main Beam Overlap Diagnostics for Tuning the RHIC Electron Lenses”, in Proc. North American Particle Accelerator Conf. (NAPAC'16), Chicago, IL, USA, Oct. 2016, pp. 20-24.
P. Thieberger et al., “Proposed Scattered Electron Detector System as One of the Beam Overlap Diagnostic Tools for the New RHIC Electron Lens”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper MOP209, pp. 489-491.


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