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Author: W. Blokland


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Reference
R. M. Thurman-Keup et al., “Installation Status of the Electron Beam Profiler for the Fermilab Main Injector”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 535-539.
C. C. Peters, T. B. Southern, W. Blokland, and T. A. Justice, “Minimizing Errant Beam at the Spallation Neutron Source”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 491-498.
R. M. Thurman-Keup et al., “Commissioning and First Results of the Electron Beam Profiler in the Main Injector at Fermilab”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 330-334.
W. Blokland and F. G. Garcia, “A Study of the Effect of Imperfections in the Optical Path of the SNS* Target Imaging System Using a Mock-up”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 384-387.
V. V. Danilov et al., “Accumulation of High Intensity Beam and First Observations of Instabilities in the SNS Accumulator Ring”, in Proc. 39th ICFA Advanced Beam Dynamics Workshop on High-Intensity and High-Brightness Hadron Beams (HB'06), Tsukuba, Japan, May-Jun. 2006, paper TUAX01, pp. 59-63.
W. Blokland and C. D. Long, “A Software Upgrade for the SNS Wire-Scanner”, in Proc. 13th Beam Instrumentation Workshop (BIW'08), Lake Tahoe, CA, USA, May 2008, paper TUPTPF055, pp. 241-243.
W. Blokland, T. J. McManamy, and T. J. Shea, “SNS Target Imaging System Software and Analysis”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM003, pp. 93-97.
W. Blokland and G. Armstrong, “A CompactRIO-based Beam Loss Monitor for the SNS RF Test Cave”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper TUPC006, pp. 1050-1052.
C. K. Allen, W. Blokland, S. M. Cousineau, and J. Galambos, “Extracting Information Content within Noisy, Sampled Profile Data from Charged Particle Beams”, in Proc. 42nd ICFA Advanced Beam Dynamics Workshop on High-Intensity and High-Brightness Hadron Beams (HB'08), Nashville, TN, USA, Aug. 2008, paper WGF13, pp. 479-481.
W. Blokland, “Non-invasive Beam Profile Measurements using an Electron-Beam Scanner”, in Proc. 46th ICFA Advanced Beam Dynamics Workshop on High-Intensity and High-Brightness Hadron Beams (HB'10), Morschach, Switzerland, Sep.-Oct. 2010, paper WEO2A03, pp. 438-442.


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