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Author: G. Penco


References



Reference
C. J. Bocchetta et al., “FERMI @ Elettra: A Seeded Harmonic Cascade FEL for EUV and Soft X-Rays”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper FROA003, pp. XX-XX.
M. Trovo, M. B. Danailov, W. Graves, S. M. Lidia, and G. Penco, “Frequency Modulation Effects in the Photoinjector for the FERMI @ Elettra FEL”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THPP059, pp. XX-XX.
G. Penco, S. M. Lidia, and M. Trovo, “The RF Injector for the FERMI @ Elettra Seeded X-Ray FEL”, in Proc. 27th Int. Free Electron Laser Conf. (FEL'05), Palo Alto, CA, USA, Aug. 2005, paper THPP060, pp. XX-XX.
S. Di Mitri et al., “Beam Physics Highlights of the [email protected] Project”, in Proc. 37th ICFA Advanced Beam Dynamics Workshop on Future Light Sources (FLS'06), Hamburg, Germany, May 2006, paper WG313, pp. XX-XX.
P. Michelato, D. Barni, C. Pagani, and G. Penco, “Thermal Properties Measurements Using Laser Flash Technique at Cryogenic Temperature”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper MPPH321, pp. XX-XX.
M. Pedrozzi et al., “First Operational Results of the 3rd Harmonic Super Conducting Cavities in SLS and ELETTRAFIRST OPERATIONAL RESULTS OF THE 3RD HARMONIC SUPER CONDUCTING CAVITIES IN SLS AND ELETTRA”, in Proc. 20th Particle Accelerator Conf. (PAC'03), Portland, OR, USA, May 2003, paper MPPB024, pp. XX-XX.
G. D'Auria et al., “Linac Design for the FERMI Project”, in Proc. 23rd Linear Accelerator Conf. (LINAC'06), Knoxville, TN, USA, Aug. 2006, paper MOP015, pp. XX-XX.
L. Giannessi et al., “Status and Perspectives of the FERMI FEL Facility”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 19-23.
E. Allaria et al., “Non-Standard Use of Laser Heater for FEL Control and THz Generation”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 566-568.
G. L. Orlandi et al., “FERMI-PSI Collaboration on Nano-Fabricated Wire-Scanners With Sub-Micrometer Resolution: Developments and Measurements.”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 249-252.


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