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H. Suk, C. Kim, G. H. Kim, J. U. Kim, and H. J. Lee, “Electron Acceleration by Laser Wakefields in Tapered Plasma Densities”, in Proc. 20th Particle Accelerator Conf. (PAC'03), Portland, OR, USA, May 2003, paper TPPG049, pp. 1912-1914. |
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C. Kim, N. Hafz, G.-H. Kim, I. S. Ko, and H. Suk, “Generation of Small Energy Spread Electron Beam from Self-Modulated Laser Wakefield Accelerator”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper TPAE005, pp. 976-978. |
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S. J. Park et al., “Status of PPI (Pohang Photo-Injector) for PAL XFEL”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper WPAP021, pp. 1733-1735. |
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C. Kim, A. Jackson, and A. Warwick, “Beam Lifetime and Beam Brightness in ALS”, in Proc. 16th Particle Accelerator Conf. (PAC'95), Dallas, TX, USA, May 1995, paper FAA03, pp. 198-200. |
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D. Robin, C. Kim, and A. Sessler, “Compton Scattering in the ALS Booster”, in Proc. 16th Particle Accelerator Conf. (PAC'95), Dallas, TX, USA, May 1995, paper FAA06, pp. 207-209. |
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A. Zholents et al., “Modification of the ALS Booster Synchrotron for an Experiment on Optical Stochastic Cooling”, in Proc. 17th Particle Accelerator Conf. (PAC'97), Vancouver, Canada, May 1997, paper 7W025, pp. 808-810. |
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H. J. Lee, J. Kim, C. Kim, G. H. Kim, J. U. Kim, and H. Suk, “Simulations of Photon Acceleration and Laser Pulse Amplification Using Laser Plasma Interactions”, in Proc. 21st Linear Accelerator Conf. (LINAC'02), Gyeongju, Korea, Aug. 2002, paper TH427, pp. 662-664. |
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D. C. Shin, J. H. Hong, H.-S. Kang, C. Kim, G. Kim, and C.-K. Min, “Development of BAM Electronics in PAL-XFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 400-403. |
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C. Kim, H.-S. Kang, G. Kim, I. S. Ko, and J. H. Ko, “Micro-Bunching Instability Monitor for X-ray Free Electron Laser”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 404-406. |
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G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, “Wire Scanner Measurements at the PAL-XFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 445-447. |
