JaCoW Logo

Reference Search

Author: C. A. Dennett


References



Reference
W. Hartung et al., “Measurements of Secondary Electron Yield of Metal Surfaces and Films with Exposure to a Realistic Accelerator Environment”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper THPFI087, pp. 3493-3495.


Back to the list