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Author: M. Yan


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Reference
G. Kube, C. Behrens, C. Gerth, B. Schmidt, W. Lauth, and M. Yan, “Inorganic Scintillators for Particle Beam Profile Diagnostics of Highly Brilliant and Highly Energetic Electron Beams”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper WEOAA02, pp. 2119-2121.
M. Yan and C. Gerth, “Single-bunch Longitudinal Phase Space Diagnostics in Multi-bunch Mode at the European XFEL”, in Proc. 4th Int. Particle Accelerator Conf. (IPAC'13), Shanghai, China, May 2013, paper MOPME012, pp. 494-496.
V. Balandin et al., “Operation of Free Electron Laser FLASH Driven by Short Electron Pulses”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 732-734.
M. Yan, A.-S. Müller, M. J. Nasse, M. Schuh, and M. Schwarz, “Optimization of THz Radiation Pulses at Flute”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 3067-3069.
T. Boltz et al., “Studies of Longitudinal Dynamics in the Micro-Bunching Instability Using Machine Learning”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 3277-3279.
A. Malygin et al., “Commissioning Status of FLUTE”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 4229-4231.
S. Funkner et al., “Implementation of Ultra-Low Frequency Non-Linear Raman Spectroscopy with the Gun Laser at FLUTE”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 4242-4244.
M. Yan et al., “FLUTE Diagnostics Integration”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 2227-2229.
E. Hass, C. Behrens, C. Gerth, B. Schmidt, M. Yan, and S. Wesch, “Longitudinal Bunch Profile Reconstruction Using Broadband Coherent Radiation at FLASH”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPC37, pp. 154-157.
M. Yan et al., “First Realization and Performance Study of a Single-Shot Longitudinal Bunch Profile Monitor Utilizing a Transverse Deflecting Structure”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper TUPC36, pp. 456-459.


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