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Author: T. Ishikawa


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Reference
T. Inagaki et al., “Hard X-ray Self-Seeding Setup and Results at SACLA”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper TUC01, pp. 603-608.
T. Ohata et al., “Design of an XFEL Beamline DAQ System”, in Proc. 12th Int. Conf. on Accelerator and Large Experimental Physics Control Systems (ICALEPCS'09), Kobe, Japan, Oct. 2009, paper WEP017, pp. 438-440.
H. Tomizawa et al., “Feasibility Study of Radial EO-Sampling Monitor to Measure 3D Bunch Charge Distributions”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper MOPE006, pp. 963-965.
K. Togawa et al., “Progress of the SCSS Test Accelerator for XFEL/SPring-8”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper TH3PBI02, pp. 3120-3124.
M. Nakao et al., “Optical Measurement System of Laser-Cooled Mg Ion Beam”, in Proc. 23rd Particle Accelerator Conf. (PAC'09), Vancouver, Canada, May 2009, paper TH5PFP029, pp. 3257-3259.
A. Noda et al., “Experimental Approach to Ultra-Cold Ion Beam at S-LSR”, in Proc. 22nd Particle Accelerator Conf. (PAC'07), Albuquerque, NM, USA, Jun. 2007, paper WEOCC01, pp. 2035-2037.
M. Yabashi et al., “Photon Optics at SCSS”, in Proc. 28th Int. Free Electron Laser Conf. (FEL'06), Berlin, Germany, Aug.-Sep. 2006, paper FRAAU01, pp. 785-792.
H. Hanaki, T. Ishikawa, and H. T. Tomizawa, “Non-Destructive Single-Shot 3-D Electron Bunch Monitor with Femtosecond-Timing All-Optical System for Pump & Probe Experiments”, in Proc. 29th Int. Free Electron Laser Conf. (FEL'07), Novosibirsk, Russia, Aug. 2007, paper WEPPH053, pp. 472-475.
M. Hasegawa et al., “High Average Beam Current Acceleration at JNC High power Electron LINAC”, in Proc. 7th European Particle Accelerator Conf. (EPAC'00), Vienna, Austria, Jun. 2000, paper THP1A01, pp. 815-817.
T. Shintake et al., “Status of SCSS: Spring-8 Compact SASE Source Project”, in Proc. 8th European Particle Accelerator Conf. (EPAC'02), Paris, France, Jun. 2002, paper TUPRI116, pp. 840-842.


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