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Author: T. Ishikawa


References



Reference
H. Tanaka et al., “Operation Status of the SCSS Test Accelerator: Continuous Saturation of SASE FEL at the Wavelength Range from 50 to 60 nanometers”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper WEOAM01, pp. 1944-1946.
T. Tanaka et al., “SASE Saturation at the SCSS Test Accelerator Ranging from 50 nm to 60 nm”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper FRAAU02, pp. 537-542.
T. Tanikawa et al., “Spectral Characteristics of the Seeded FEL Using Higher Harmonic Generation in a Gas at the SCSS Test Accelerator”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper MOPPH054, pp. 106-109.
T. Hara et al., “VUV Seeded FEL Experiment at the SCSS Test Accelerator”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUBAU01, pp. 207-212.
G. Lambert et al., “FEL Emissions at 160 nm in Seeded Configuration on the SCSS Test Accelerator”, in Proc. 30th Int. Free Electron Laser Conf. (FEL'08), Gyeongju, Korea, Aug. 2008, paper TUPPH080, pp. 429-431.
H. Tanaka et al., “High Performance SASE FEL Achieved by Stability-Oriented Accelerator System”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper FROA01, pp. 758-765.
P. Merc?¿re et al., “Spatial Characterization of FEL Self-Amplified Spontaneous Emission”, in Proc. 31st Int. Free Electron Laser Conf. (FEL'09), Liverpool, UK, Aug. 2009, paper WEOD03, pp. 702-705.
T. Togashi et al., “First Observation of the 61.5 nm Seeded FEL at the SCSS Test Accelerator”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper MOOAI7, pp. 13-13.
H. Tomizawa et al., “Novel Nondestructive Shot-by-Shot Monitor to Measure 3D Bunch Charge Distribution With a Femtosecond EO-Sampling”, in Proc. 32nd Int. Free Electron Laser Conf. (FEL'10), Malmö, Sweden, Aug. 2010, paper WEPB20, pp. 445-448.
H. Tomizawa et al., “Stable Operation of HHG-Seeded EUV-FEL at the SCSS Test Accelerator”, in Proc. 35th Int. Free Electron Laser Conf. (FEL'13), New York, NY, USA, Aug. 2013, paper THOANO01, pp. 728-733.


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