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Author: R. Kramert


References



Reference
B. Keil et al., “A Generic BPM Electronics Platform for European XFEL, SwissFEL and SLS”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOCB02, pp. 11-15.
C. S. Simon et al., “New Electronics Design for the European XFEL Re-entrant Cavity Monitor”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA15, pp. 83-86.
M. Stadler et al., “Beam Test Results of Undulator Cavity BPM Electronics for the European XFEL”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper TUPA27, pp. 404-408.
B. Keil et al., “Design of the SwissFEL BPM System”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper TUPC25, pp. 427-430.
R. Ischebeck et al., “Overview of Beam Instrumentation Activities for SwissFEL”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper MOPF31, pp. 119-123.
D. Lipka et al., “FLASH Undulator BPM Commissioning and Beam Characterization Results”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper TUPF07, pp. 315-319.
B. Keil et al., “Status of The SwissFEL BPM System”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 497-501.
D. Lipka et al., “First Experience with the Standard Diagnostics at the European XFEL Injector”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 14-19.
V. Schlott et al., “Commissioning Results and First Operational Experience with SwissFEL Diagnostics”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 104-108.
V. R. Arsov et al., “Design and Commissioning of the Bunch Arrival-Time Monitor for SwissFEL”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 182-185.


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