[n] C. S. Simon et al., “New Electronics Design for the European XFEL Re-entrant Cavity Monitor”, in Proc. IBIC'12, Tsukuba, Japan, Oct. 2012, paper MOPA15, pp. 83-86.
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Paper Title: New Electronics Design for the European XFEL Re-entrant Cavity Monitor
Paper URL: https://jacow.org//IBIC2012/papers/MOPA15.pdf
Conference: 1st Int. Beam Instrumentation Conf. (IBIC'12)
Paper ID: MOPA15
Location in proceedings: 83-86
Original Author String: C.S. Simon [CEA/DSM/IRFU, France] N. Baboi [DESY, Hamburg, Germany] R. Baldinger, B. Keil, R. Kramert, G. Marinkovic, M. Roggli, M. Stadler [PSI, Villigen PSI, Switzerland]