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Author: R. Kramert


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Reference
B. Keil et al., “A Generic BPM Electronics Platform for European XFEL, SwissFEL and SLS”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOCB02, pp. 11-15.
B. Keil et al., “Design of an Intra-Bunch-Train Feedback System for the European X-Ray FEL”, in Proc. 8th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'07), Venice, Italy, May 2007, paper WEPB02, pp. 232-234.
B. Keil et al., “Design of the SwissFEL BPM System”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper TUPC25, pp. 427-430.
B. Keil et al., “First Beam Commissioning Experience With The SwissFEL Cavity BPM System”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 251-254.
B. Keil et al., “Status of The SwissFEL BPM System”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 497-501.
B. Keil et al., “The European XFEL Beam Position Monitor System”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper MOPE064, pp. 1125-1127.
B. Keil et al., “The Generic VME PMC Carrier Board: A Common Digital Hardware Platform for Beam Diagnostics and Feedbacks at PSI”, in Proc. 9th European Particle Accelerator Conf. (EPAC'04), Lucerne, Switzerland, Jul. 2004, paper THPLT022, pp. 2517-2519.
B. Keil et al., “The PSI quot;VPCquot; Board - First Applications of a Common Digital Back-End for Electron and Proton Beam Instrumentation at PSI”, in Proc. 7th European Workshop on Beam Diagnostics and Instrumentation for Particle Accelerators (DIPAC'05), Lyon, France, Jun. 2005, paper CTTM02, pp. XX-XX.
B. Keil, R. Kramert, G. Marinkovic, P. Pollet, and M. Roggli, “The PSI DSP Carrier (PDC) Board - a Digital Back-end for Bunch-to-bunch and Global Orbit Feedbacks in Linear Accelerators and Storage Rings”, in Proc. 11th European Particle Accelerator Conf. (EPAC'08), Genoa, Italy, Jun. 2008, paper THPC123, pp. 3272-3274.
C. S. Simon et al., “New Electronics Design for the European XFEL Re-entrant Cavity Monitor”, in Proc. 1st Int. Beam Instrumentation Conf. (IBIC'12), Tsukuba, Japan, Oct. 2012, paper MOPA15, pp. 83-86.


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