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Author: B. S. Sian


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Reference
B. S. Sian et al., “Graphene Coating for the Reduction of the Secondary Electron Yield”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 3688-3690.
B. S. Sian, G. Burt, O. B. Malyshev, H. S. Marks, D. J. Seal, and R. Valizadeh, “Split Thin Film SRF 6 GHz Cavities”, in Proc. 31st Linear Accelerator Conf. (LINAC'22), Liverpool, UK, Aug.-Sep. 2022, pp. 814-817.
B. S. Sian, O. B. Malyshev, and R. Valizadeh, “LASE Surfaces for Mitigation of Electron Cloud in Accelerators”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 3958-3960.
C. Pira et al., “Progress in European Thin Film Activities”, presented at the 21th Int. Conf. RF Superconductivity (SRF'23), Grand Rapids, MI, USA, Jun. 2023, paper WECAA01, unpublished.
D. J. Seal et al., “A Low Power Test Facility for SRF Thin Film Testing with High Sample Throughput Rate”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 100.
D. J. Seal et al., “First RF Measurements of Planar SRF Thin Films with a High Throughput Test Facility at Daresbury Laboratory”, in Proc. 13th Int. Particle Accelerator Conf. (IPAC'22), Bangkok, Thailand, Jun. 2022, pp. 1283-1286.
D. J. Seal et al., “RF Characterisation of Bulk Niobium and Thin Film Coated Planar Samples at 7.8 GHz”, in Proc. 31st Linear Accelerator Conf. (LINAC'22), Liverpool, UK, Aug.-Sep. 2022, pp. 818-821.
J. Wang et al., “Comparison Studies of Graphene Sey Results in NSRL and DL”, in Proc. 8th Int. Particle Accelerator Conf. (IPAC'17), Copenhagen, Denmark, May 2017, pp. 3196-3199.
N. L. Leicester et al., “Development and Testing of Split 6 GHz Cavities With Niobium Coatings”, presented at the 21th Int. Conf. RF Superconductivity (SRF'23), Grand Rapids, MI, USA, Jun. 2023, paper MOPMB001, unpublished.
O. B. Malyshev et al., “Main Highlights of ARIES WP15 Collaboration”, in Proc. 20th International Conference on RF Superconductivity (SRF'21), East Lansing, MI, USA, Jun.-Jul. 2021, pp. 571.


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