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Author: D. C. Shin


References



Reference
J. Lee et al., “Bunch by Bunch Position Measurement and Analysis at PLS-II”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 232-234.
C. Kim et al., “Diagnostic Systems of the PAL-XFEL”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 2091-2094.
C. Kim et al., “Diagnostic Systems for the PAL-XFEL Commissioning”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 11-13.
C. Kim, J. H. Hong, H.-S. Kang, I. S. Ko, S. J. Lee, and D. C. Shin, “Stripline Beam Position Monitor for the PAL-XFEL”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 274-277.
S. J. Lee et al., “PAL-XFEL Cavity BPM Prototype Beam Test at ITF”, in Proc. 37th Int. Free Electron Laser Conf. (FEL'15), Daejeon, Korea, Aug. 2015, pp. 468-470.
D. C. Shin, J. H. Hong, H.-S. Kang, C. Kim, G. Kim, and C.-K. Min, “Development of BAM Electronics in PAL-XFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 400-403.
G. Kim, H.-S. Kang, C. Kim, B. G. Oh, and D. C. Shin, “Wire Scanner Measurements at the PAL-XFEL”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 445-447.
H. Yang and D. C. Shin, “Beam Loss Monitor for Undulators in PAL-XFEL”, in Proc. 38th Int. Free Electron Laser Conf. (FEL'17), Santa Fe, NM, USA, Aug. 2017, pp. 511-514.
I. H. Nam, J. Hu, S. H. Jung, H.-S. Kang, C.-K. Min, and D. C. Shin, “High Precision Laser Synchronization and Shot-by-Shot Timing Manipulation for Femtosecond X-Ray Experiments”, in Proc. 11th Int. Particle Accelerator Conf. (IPAC'20), Caen, France, May 2020, paper WEYYPLS02, pp. XX-XX.


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