Reference Search

[n]	C. Kim et al., “Diagnostic Systems for the PAL-XFEL Commissioning”, in Proc. IBIC'16, Barcelona, Spain, Sep. 2016, pp. 11-13. doi:10.18429/JACoW-IBIC2016-MOBL01

Paper Title: Diagnostic Systems for the PAL-XFEL Commissioning
Paper URL: https://jacow.org/ibic2016/papers/MOBL01.pdf
Conference: 5th Int. Beam Instrumentation Conf. (IBIC'16)
Paper ID: MOBL01
Location in proceedings: 11-13
Original Author String: C. Kim, S.Y. Baek, H. J. Choi, J.H. Hong, H.-S. Kang, G. Kim, J.H. Kim, I.S. Ko, S.J. Lee, G. Mun, B.G. Oh, B.R. Park, D.C. Shin, Y.J. Suh, H. Yang [PAL, Pohang, Kyungbuk, Republic of Korea]

Associated Authors

• J. H. Kim
• H. Yang
• H.-S. Kang
• C. Kim
• J. H. Hong
• I. S. Ko
• H. J. Choi
• B. R. Park
• B. G. Oh
• Y. J. Suh
• G. Kim
• D. C. Shin
• S. J. Lee
• S. Y. Baek
• G. Mun