JaCoW Logo

Reference Search

Author: S. J. Lee


References



Reference
C. Kim et al., “Diagnostic Systems for the PAL-XFEL Commissioning”, in Proc. 5th Int. Beam Instrumentation Conf. (IBIC'16), Barcelona, Spain, Sep. 2016, pp. 11-13.
C. Kim et al., “Diagnostic Systems of the PAL-XFEL”, in Proc. 7th Int. Particle Accelerator Conf. (IPAC'16), Busan, Korea, May 2016, pp. 2091-2094.
C. Kim, J. H. Hong, H.-S. Kang, I. S. Ko, S. J. Lee, and D. C. Shin, “Stripline Beam Position Monitor for the PAL-XFEL”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 274-277.
C. Xu et al., “Commissioning Results of MicroTCA.4 Stripline BPM System”, in Proc. 3rd Int. Beam Instrumentation Conf. (IBIC'14), Monterey, CA, USA, Sep. 2014, paper WEPD17, pp. 680-683.
H. J. Choi et al., “About BPMS to be Used for PAL-XFEL”, in Proc. 2nd Int. Beam Instrumentation Conf. (IBIC'13), Oxford, UK, Sep. 2013, paper MOPC25, pp. 112-115.
H. Kim et al., “RAON Superconducting Radio Frequency Test Facility Construction”, in Proc. 27th Linear Accelerator Conf. (LINAC'14), Geneva, Switzerland, Aug.-Sep. 2014, paper TUPP086, pp. 625-627.
J. H. Han et al., “Beam Operation of the PAL-XFEL Injector Test Facility”, in Proc. 36th Int. Free Electron Laser Conf. (FEL'14), Basel, Switzerland, Aug. 2014, paper WEB02, pp. 615-622.
J. H. Han, J. Lee, S. B. Lee, S. J. Lee, and T.-Y. Lee, “Feasibility Study of High Energy X-Ray Source at PLS-II”, in Proc. 60th ICFA Advanced Beam Dynamics Workshop on Future Light Sources (FLS'18), Shanghai, China, Mar. 2018, pp. 138-141.
J. H. Han, Y. G. Jung, D. E. Kim, and S. J. Lee, “Spare Undulator Production for PAL-XFEL HX1 Beamline”, in Proc. 39th Int. Free Electron Laser Conf. (FEL'19), Hamburg, Germany, Aug. 2019, pp. 524-527.
J. H. Han, Y. G. Jung, D. E. Kim, S. J. Lee, and G. Mun, “RADFET Installation at PAL-XFEL Undulator”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 4366-4368.


Back to the list