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Author: J. R. Zagel


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Reference
R. M. Thurman-Keup et al., “Commissioning and First Results of the Electron Beam Profiler in the Main Injector at Fermilab”, in Proc. 6th Int. Beam Instrumentation Conf. (IBIC'17), Grand Rapids, MI, USA, Aug. 2017, pp. 330-334.
R. M. Thurman-Keup et al., “Installation Status of the Electron Beam Profiler for the Fermilab Main Injector”, in Proc. 4th Int. Beam Instrumentation Conf. (IBIC'15), Melbourne, Australia, Sep. 2015, pp. 535-539.
R. M. Thurman-Keup, C. E. Lundberg, D. Slimmer, and J. R. Zagel, “A Study of the Gain of Microchannel Plates in the Ionization Profile Monitors at Fermilab”, in Proc. 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper WEP025, pp. 405-409.
S. D. Holmes, J. D. McCarthy, S. A. Sommers, R. C. Webber, and J. R. Zagel, “The TeV I Beam Position Monitor System”, in Proc. 11th Particle Accelerator Conf. (PAC'85), Vancouver, Canada, May 1985, pp. 1927-1930.
V. D. Shiltsev et al., “Channeling and Volume Reflection Based Crystal Collimation of the Tevatron Circulating Beam Halo (T980)”, in Proc. 1st Int. Particle Accelerator Conf. (IPAC'10), Kyoto, Japan, May 2010, paper TUOAMH03, pp. 1243-1245.
V. V. Zvoda et al., “Advanced Bent Crystal Collimation Studies at the Tevatron (T-980)”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper MOODN3, pp. 73-75.


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