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Author: J. R. Zagel


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Reference
A. A. Hahn and J. R. Zagel, “Observation of Bethe-Bloch Ionization using the Booster Ion Profile Monitor”, in Proc. 18th Particle Accelerator Conf. (PAC'99), New York, NY, USA, Mar. 1999, paper THAR4, pp. 468-470.
A. Jansson et al., “An Ionization Profile Monitor for the Tevatron”, in Proc. 21st Particle Accelerator Conf. (PAC'05), Knoxville, TN, USA, May 2005, paper RPAT032, pp. 2227-2229.
A. Jansson et al., “IPM Measurements in the Tevatron”, in Proc. 22nd Particle Accelerator Conf. (PAC'07), Albuquerque, NM, USA, Jun. 2007, paper FRPMS008, pp. 3883-3885.
A. Jansson et al., “Tevatron Ionization Profile Monitoring”, in Proc. 10th European Particle Accelerator Conf. (EPAC'06), Edinburgh, UK, Jun. 2006, paper THYFI01, pp. 2777-2780.
D. A. Still et al., “Recent T980 Crystal Collimation Studies at the Tevatron Exploiting a Pixel Detector System and a Multi-strip Crystal Array”, in Proc. 3rd Int. Particle Accelerator Conf. (IPAC'12), New Orleans, LA, USA, May 2012, paper MOPPD082, pp. 559-561.
D. K. Morris et al., “Operational Use of Ionization Profile Monitors in the Fermilab Main Injector”, in Proc. 24th Particle Accelerator Conf. (PAC'11), New York, NY, USA, Mar.-Apr. 2011, paper MOP222, pp. 519-521.
J. R. Zagel and L. J. Chapman, “A Vacuum Control Subsystem for the Fermilab Tevatron”, in Proc. 9th Particle Accelerator Conf. (PAC'81), Washington D.C., USA, Mar. 1981, pp. 2305-2308.
J. R. Zagel et al., “Operational Use of Ionization Profile Monitors at Fermilab”, in Proc. 14th Beam Instrumentation Workshop (BIW'10), Santa Fe, NM, USA, May 2010, paper TUPSM009, pp. 111-115.
J. R. Zagel et al., “Permanent Magnet Ion Profile Monitor at the Fermilab Main Injector”, in Proc. 19th Particle Accelerator Conf. (PAC'01), Chicago, IL, USA, Jun. 2001, paper TPAH036, pp. 1303-1305.
J. R. Zagel et al., “Tevatron Satellite Refrigeration Control Subystem”, in Proc. 9th Particle Accelerator Conf. (PAC'81), Washington D.C., USA, Mar. 1981, pp. 2153-2155.


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