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[n]	J. R. Zagel et al., “Operational Use of Ionization Profile Monitors at Fermilab”, in Proc. BIW'10, Santa Fe, NM, USA, May 2010, paper TUPSM009, pp. 111-115. 

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Paper Title: Operational Use of Ionization Profile Monitors at Fermilab
Paper URL: https://jacow.org/BIW2010/papers/TUPSM009.pdf
Conference: 14th Beam Instrumentation Workshop (BIW'10)
Paper ID: TUPSM009
Location in proceedings: 111-115
Original Author String: J.R. Zagel, A. Jansson, T. Meyer, D.K. Morris, D. Slimmer, T. Todd, M.-J. Yang, Fermilab, Batavia

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