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Author: D. M. Haider


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Reference
D. M. Haider et al., “Beam Intensity Monitoring with nA Resolution - the Cryogenic Current Comparator (CCC)”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 130-133.
D. M. Haider et al., “Versatile Beamline Cryostat for the Cryogenic Current Comparator (CCC) for FAIR”, in Proc. 8th Int. Beam Instrumentation Conf. (IBIC'19), Malmö, Sweden, Sep. 2019, pp. 78-81.
J. Golm et al., “A Cryogenic Current Comparators (CCC) Customized for FAIR-Project”, in Proc. 9th Int. Particle Accelerator Conf. (IPAC'18), Vancouver, Canada, Apr.-May 2018, pp. 2088-2090.
J. Golm et al., “Different Versions of Cryogenic Current Comparators with Magnetic Core for Beam Current Measurements”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 3431-3434.
L. Crescimbeni et al., “Axial Cryogenic Current Comparator (CCC) for FAIR”, in Proc. 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper TUP034, pp. 259-262.
L. Crescimbeni et al., “The Cryogenic Current Comparator at CRYRING@ESR”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 300-303.
T. Sieber et al., “Cryogenic Current Comparators as Low Intensity Diagnostics for Ion Beams”, in Proc. 12th International Beam Instrumentation Conference (IBIC'23), Saskatoon, Canada # e.g. "Barcelona, Spain" or "San Francisco, CA, USA", Sep. 2023, paper TUP036, pp. 268-272.
T. Sieber et al., “Next Generation Cryogenic Current Comparator (CCC) for nA Intensity Measurement”, in Proc. 10th Int. Particle Accelerator Conf. (IPAC'19), Melbourne, Australia, May 2019, pp. 2510-2513.
V. Tympel et al., “Comparative Measurement and Characterisation of Three Cryogenic Current Comparators Based on Low-Temperature Superconductors”, in Proc. 7th Int. Beam Instrumentation Conf. (IBIC'18), Shanghai, China, Sep. 2018, pp. 126-129.
V. Tympel et al., “Creation of the First High-Inductance Sensor of the New CCC-Sm Series”, in Proc. 11th Int. Beam Instrumentation Conference (IBIC'22), Kraków, Poland, Sep. 2022, pp. 469-472.


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